Chengen Yang, Yunus Emre, Yu Cao, Chaitali Chakrabarti. Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding. EURASIP J. Adv. Sig. Proc., 2012:211, 2012. [doi]
@article{YangECC12,
title = {Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding},
author = {Chengen Yang and Yunus Emre and Yu Cao and Chaitali Chakrabarti},
year = {2012},
doi = {10.1186/1687-6180-2012-211},
url = {http://dx.doi.org/10.1186/1687-6180-2012-211},
researchr = {https://researchr.org/publication/YangECC12},
cites = {0},
citedby = {0},
journal = {EURASIP J. Adv. Sig. Proc.},
volume = {2012},
pages = {211},
}