A novel feature line segment approach for pattern classification

Yi Yang, Chongzhao Han, Deqiang Han. A novel feature line segment approach for pattern classification. In 12th International Conference on Information Fusion, FUSION '09, Seattle, Washington, USA, July 6-9, 2009. pages 490-497, IEEE, 2009. [doi]

Authors

Yi Yang

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Chongzhao Han

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Deqiang Han

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