Yi Yang, Chongzhao Han, Deqiang Han. A novel feature line segment approach for pattern classification. In 12th International Conference on Information Fusion, FUSION '09, Seattle, Washington, USA, July 6-9, 2009. pages 490-497, IEEE, 2009. [doi]
@inproceedings{YangHH09-2,
title = {A novel feature line segment approach for pattern classification},
author = {Yi Yang and Chongzhao Han and Deqiang Han},
year = {2009},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5203743},
researchr = {https://researchr.org/publication/YangHH09-2},
cites = {0},
citedby = {0},
pages = {490-497},
booktitle = {12th International Conference on Information Fusion, FUSION '09, Seattle, Washington, USA, July 6-9, 2009},
publisher = {IEEE},
isbn = {978-0-9824438-0-4},
}