Hsin-Chia Yang, Kai-Hung Hsieh, Hsiu-Hsien Yu, Chun-Yian Chang, Kun-Hong Liao, Yu-Jung Liao, Sung-Ching Chi. An Alternative Algorithm to Fit All-Aspect Current-Voltage Characteristics Curves on FinFET Devices. In IEEE 2nd International Conference on Knowledge Innovation and Invention, ICKII 2019, Seoul, Korea (South), July 12-15, 2019. pages 418-420, IEEE, 2019. [doi]
Abstract is missing.