Using Artificial Neural Back-Propagation Network Model to Detect the Outliers in Semiconductor Manufacturing Machines - researchr publication authors

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Keng-Chieh Yang, Chia-Hui Huang, Conna Yang, Pei-Yao Chao, Po-Hong Shih. Using Artificial Neural Back-Propagation Network Model to Detect the Outliers in Semiconductor Manufacturing Machines. In Moonis Ali, Jeng-Shyang Pan, Shyi-Ming Chen, Mong-Fong Horng, editors, Modern Advances in Applied Intelligence - 27th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2014, Kaohsiung, Taiwan, June 3-6, 2014, Proceedings, Part II. Volume 8482 of Lecture Notes in Computer Science, pages 240-249, Springer, 2014. [doi]

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