Keng-Chieh Yang, Chia-Hui Huang, Conna Yang, Pei-Yao Chao, Po-Hong Shih. Using Artificial Neural Back-Propagation Network Model to Detect the Outliers in Semiconductor Manufacturing Machines. In Moonis Ali, Jeng-Shyang Pan, Shyi-Ming Chen, Mong-Fong Horng, editors, Modern Advances in Applied Intelligence - 27th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2014, Kaohsiung, Taiwan, June 3-6, 2014, Proceedings, Part II. Volume 8482 of Lecture Notes in Computer Science, pages 240-249, Springer, 2014. [doi]
@inproceedings{YangHYCS14,
title = {Using Artificial Neural Back-Propagation Network Model to Detect the Outliers in Semiconductor Manufacturing Machines},
author = {Keng-Chieh Yang and Chia-Hui Huang and Conna Yang and Pei-Yao Chao and Po-Hong Shih},
year = {2014},
doi = {10.1007/978-3-319-07467-2_26},
url = {http://dx.doi.org/10.1007/978-3-319-07467-2_26},
researchr = {https://researchr.org/publication/YangHYCS14},
cites = {0},
citedby = {0},
pages = {240-249},
booktitle = {Modern Advances in Applied Intelligence - 27th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2014, Kaohsiung, Taiwan, June 3-6, 2014, Proceedings, Part II},
editor = {Moonis Ali and Jeng-Shyang Pan and Shyi-Ming Chen and Mong-Fong Horng},
volume = {8482},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-07466-5},
}