Leakage-Current-Canceling Current-Sampling Sense Amplifier for Deep Submicrometer STT-RAM

an Yang, Yanfeng Jiang. Leakage-Current-Canceling Current-Sampling Sense Amplifier for Deep Submicrometer STT-RAM. IEEE Trans. Circuits Syst. II Express Briefs, 69(9):3874-3878, 2022. [doi]

Abstract

Abstract is missing.