Jingchi Yang, David C. Keezer. A Framework for Design of Self-Repairing Digital Systems. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-10, IEEE, 2019. [doi]
@inproceedings{YangK19-10,
title = {A Framework for Design of Self-Repairing Digital Systems},
author = {Jingchi Yang and David C. Keezer},
year = {2019},
doi = {10.1109/ITC44170.2019.9000155},
url = {https://doi.org/10.1109/ITC44170.2019.9000155},
researchr = {https://researchr.org/publication/YangK19-10},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4823-6},
}