Fault Modeling and Testing of RRAM-based Computing-In Memories

Yu-Cheng Yang, Jin-Fu Li. Fault Modeling and Testing of RRAM-based Computing-In Memories. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 7-12, IEEE, 2022. [doi]

Authors

Yu-Cheng Yang

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Jin-Fu Li

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