A Polynomial Kernel Induced Distance Metric to Improve Deep Transfer Learning for Fault Diagnosis of Machines - researchr publication

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Bin Yang 0014, Yaguo Lei, Feng Jia, Naipeng Li, Zhaojun Du. A Polynomial Kernel Induced Distance Metric to Improve Deep Transfer Learning for Fault Diagnosis of Machines. IEEE Transactions on Industrial Electronics, 67(11):9747-9757, 2020. [doi]

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