Shanghui Yang, Xin Liu, Hang Su, Mengxia Zhu, Xuesong Lu. Deep Knowledge Tracing with Learning Curves. In K. Selçuk Candan, Thang N. Dinh, My T. Thai, Takashi Washio, editors, IEEE International Conference on Data Mining Workshops, ICDM 2022 - Workshops, Orlando, FL, USA, November 28 - Dec. 1, 2022. pages 282-291, IEEE, 2022. [doi]
Abstract is missing.