Shih-Chun Yang, Pang Lin, Chien-Ping Wang, Sheng Bang Huang, Chiu-Ling Chen, Pei-Fang Chiang, An-Tse Lee, Mu-Tao Chu. Failure and degradation mechanisms of high-power white light emitting diodes. Microelectronics Reliability, 50(7):959-964, 2010. [doi]
@article{YangLWHCCLC10,
title = {Failure and degradation mechanisms of high-power white light emitting diodes},
author = {Shih-Chun Yang and Pang Lin and Chien-Ping Wang and Sheng Bang Huang and Chiu-Ling Chen and Pei-Fang Chiang and An-Tse Lee and Mu-Tao Chu},
year = {2010},
doi = {10.1016/j.microrel.2010.03.007},
url = {http://dx.doi.org/10.1016/j.microrel.2010.03.007},
researchr = {https://researchr.org/publication/YangLWHCCLC10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {7},
pages = {959-964},
}