Shih-Chun Yang, Pang Lin, Chien-Ping Wang, Sheng Bang Huang, Chiu-Ling Chen, Pei-Fang Chiang, An-Tse Lee, Mu-Tao Chu. Failure and degradation mechanisms of high-power white light emitting diodes. Microelectronics Reliability, 50(7):959-964, 2010. [doi]
Abstract is missing.