Jianguo Yang, Qing Luo, Xiaoyong Xue, Haijun Jiang, Qiqiao Wu, Zhongze Han, Yue Cao, Yongkang Han, Chunmeng Dou, Hangbing Lv, Qi Liu 0010, Ming Liu 0022. 12-Cycle Endurance and 5/7ns Read/Write using ECC-Assisted Data Refresh and Offset-Canceled Sense Amplifier. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 498-499, IEEE, 2023. [doi]
@inproceedings{YangLXJWHCHDLLL23,
title = {12-Cycle Endurance and 5/7ns Read/Write using ECC-Assisted Data Refresh and Offset-Canceled Sense Amplifier},
author = {Jianguo Yang and Qing Luo and Xiaoyong Xue and Haijun Jiang and Qiqiao Wu and Zhongze Han and Yue Cao and Yongkang Han and Chunmeng Dou and Hangbing Lv and Qi Liu 0010 and Ming Liu 0022},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067752},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067752},
researchr = {https://researchr.org/publication/YangLXJWHCHDLLL23},
cites = {0},
citedby = {0},
pages = {498-499},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}