Redundant transformations for BIST testability metrics-based data path allocation

Laurence Tianruo Yang, Jon C. Muzio. Redundant transformations for BIST testability metrics-based data path allocation. In IEEE Asia Pacific Conference on Circuits and Systems 2002, APCCAS 2002, Singapore, 16-18 December 2002. pages 119-123, IEEE, 2002. [doi]

Abstract

Abstract is missing.