Measuring the quality of design pattern detection results - researchr publication authors

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Shouzheng Yang, Ayesha Manzer, Vassilios Tzerpos. Measuring the quality of design pattern detection results. In Yann-Gaël Guéhéneuc, Bram Adams, Alexander Serebrenik, editors, 22nd IEEE International Conference on Software Analysis, Evolution, and Reengineering, SANER 2015, Montreal, QC, Canada, March 2-6, 2015. pages 53-62, IEEE, 2015. [doi]

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