Shouzheng Yang, Ayesha Manzer, Vassilios Tzerpos. Measuring the quality of design pattern detection results. In Yann-Gaël Guéhéneuc, Bram Adams, Alexander Serebrenik, editors, 22nd IEEE International Conference on Software Analysis, Evolution, and Reengineering, SANER 2015, Montreal, QC, Canada, March 2-6, 2015. pages 53-62, IEEE, 2015. [doi]
@inproceedings{YangMT15,
title = {Measuring the quality of design pattern detection results},
author = {Shouzheng Yang and Ayesha Manzer and Vassilios Tzerpos},
year = {2015},
doi = {10.1109/SANER.2015.7081815},
url = {http://dx.doi.org/10.1109/SANER.2015.7081815},
researchr = {https://researchr.org/publication/YangMT15},
cites = {0},
citedby = {0},
pages = {53-62},
booktitle = {22nd IEEE International Conference on Software Analysis, Evolution, and Reengineering, SANER 2015, Montreal, QC, Canada, March 2-6, 2015},
editor = {Yann-Gaël Guéhéneuc and Bram Adams and Alexander Serebrenik},
publisher = {IEEE},
isbn = {978-1-4799-8469-5},
}