XRD Patterns and Bismuth Sticking Coefficient in Thin Films Fabricated by Ion Beam Sputtering Method

Seung-Ho Yang, Yong-Pil Park. XRD Patterns and Bismuth Sticking Coefficient in Thin Films Fabricated by Ion Beam Sputtering Method. J. Inform. and Commun. Convergence Engineering, 4(4):158-161, 2006. [doi]

Authors

Seung-Ho Yang

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Yong-Pil Park

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