Bo Yang, Emanuel M. Popovici, Michael Alan Quille, Andreas Amann, Sorin Cotofana. A supply voltage-dependent variation aware reliability evaluation model. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2016, Beijing, China, July 18-20, 2016. pages 79-84, ACM, 2016. [doi]
Abstract is missing.