Bohan Yang, Vladimir Rozic, Nele Mentens, Wim Dehaene, Ingrid Verbauwhede. Embedded HW/SW platform for on-the-fly testing of true random number generators. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 345-350, ACM, 2015. [doi]
Abstract is missing.