YuanFu Yang, Min Sun. Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 2313-2322, IEEE, 2022. [doi]
@inproceedings{YangS22-18,
title = {Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning},
author = {YuanFu Yang and Min Sun},
year = {2022},
doi = {10.1109/CVPR52688.2022.00236},
url = {https://doi.org/10.1109/CVPR52688.2022.00236},
researchr = {https://researchr.org/publication/YangS22-18},
cites = {0},
citedby = {0},
pages = {2313-2322},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6946-3},
}