Zhi-Ming Yang, Peng Sun, Yang Yu, Hui Zhang, Guoyu Gao, Xiyuan Peng. Workload-aware failure prediction method for VLSI devices using an LUT based approach. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{YangSYZGP18, title = {Workload-aware failure prediction method for VLSI devices using an LUT based approach}, author = {Zhi-Ming Yang and Peng Sun and Yang Yu and Hui Zhang and Guoyu Gao and Xiyuan Peng}, year = {2018}, doi = {10.1109/I2MTC.2018.8409562}, url = {https://doi.org/10.1109/I2MTC.2018.8409562}, researchr = {https://researchr.org/publication/YangSYZGP18}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018}, publisher = {IEEE}, isbn = {978-1-5386-2222-3}, }