Zhi-Ming Yang, Peng Sun, Yang Yu, Hui Zhang, Guoyu Gao, Xiyuan Peng. Workload-aware failure prediction method for VLSI devices using an LUT based approach. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.