Joon-Sung Yang, Nur A. Touba. Enhancing Silicon Debug via Periodic Monitoring. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 125-133, IEEE Computer Society, 2008. [doi]
@inproceedings{YangT08:6,
title = {Enhancing Silicon Debug via Periodic Monitoring},
author = {Joon-Sung Yang and Nur A. Touba},
year = {2008},
doi = {10.1109/DFT.2008.57},
url = {http://dx.doi.org/10.1109/DFT.2008.57},
tags = {debugging},
researchr = {https://researchr.org/publication/YangT08%3A6},
cites = {0},
citedby = {0},
pages = {125-133},
booktitle = {23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA},
editor = {Cristiana Bolchini and Yong-Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}