Xiao-liang Yang, Ying Wang, Bin Du, Cheng-Hao Yu. Total dose radiation effects of hybrid bulk/SOI CMOS active pixel with buried channel SOI source follower. Microelectronics Journal, 45(4):477-481, 2014. [doi]
@article{YangWDY14,
title = {Total dose radiation effects of hybrid bulk/SOI CMOS active pixel with buried channel SOI source follower},
author = {Xiao-liang Yang and Ying Wang and Bin Du and Cheng-Hao Yu},
year = {2014},
doi = {10.1016/j.mejo.2014.02.021},
url = {http://dx.doi.org/10.1016/j.mejo.2014.02.021},
researchr = {https://researchr.org/publication/YangWDY14},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {45},
number = {4},
pages = {477-481},
}