SILT: Shadow-aware Iterative Label Tuning for Learning to Detect Shadows from Noisy Labels

Han Yang, Tianyu Wang, Xiaowei Hu, Chi-Wing Fu. SILT: Shadow-aware Iterative Label Tuning for Learning to Detect Shadows from Noisy Labels. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 12641-12652, IEEE, 2023. [doi]

Abstract

Abstract is missing.