On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs

Ming-Ta Yang, Yo-Jen Wang, Patricia Pei-Chen Ho, Tzu-Jin Yeh, Darryl Chih-Wei Kuo, Chin-Wei Kuo. On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs. IEICE Transactions, 88-C(5):838-844, 2005. [doi]

Abstract

Abstract is missing.