On NBTI Degradation Process in Digital Logic Circuits - researchr publication authors

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Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja. On NBTI Degradation Process in Digital Logic Circuits. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 723-730, IEEE Computer Society, 2007. [doi]

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