Josh Yang, Baosheng Wang, Yuejian Wu, André Ivanov. Fast detection of data retention faults and other SRAM cell open defects. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(1):167-180, 2006. [doi]
@article{YangWWI06,
title = {Fast detection of data retention faults and other SRAM cell open defects},
author = {Josh Yang and Baosheng Wang and Yuejian Wu and André Ivanov},
year = {2006},
doi = {10.1109/TCAD.2005.852680},
url = {http://dx.doi.org/10.1109/TCAD.2005.852680},
tags = {data-flow, source-to-source, open-source},
researchr = {https://researchr.org/publication/YangWWI06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {1},
pages = {167-180},
}