A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs

Zixuan Yang, Qian Xie, Qiao He, Meng Zhao, Zheng Wang 0050. A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs. In 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2021, Zhuhai, China, November 24-26, 2021. pages 99-100, IEEE, 2021. [doi]

Abstract

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