Development of Machine Vision System for Off-Line Inspection of Fine Defects on Glass Screen Surface

Weilin Yang, Yongwei Zhang, Yue Dong, Dezhi Xu, Tinglong Pan. Development of Machine Vision System for Off-Line Inspection of Fine Defects on Glass Screen Surface. IEEE T. Instrumentation and Measurement, 71:1-8, 2022. [doi]

Authors

Weilin Yang

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Yongwei Zhang

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Yue Dong

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Dezhi Xu

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Tinglong Pan

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