Weilin Yang, Yongwei Zhang, Yue Dong, Dezhi Xu, Tinglong Pan. Development of Machine Vision System for Off-Line Inspection of Fine Defects on Glass Screen Surface. IEEE T. Instrumentation and Measurement, 71:1-8, 2022. [doi]
@article{YangZDXP22,
title = {Development of Machine Vision System for Off-Line Inspection of Fine Defects on Glass Screen Surface},
author = {Weilin Yang and Yongwei Zhang and Yue Dong and Dezhi Xu and Tinglong Pan},
year = {2022},
doi = {10.1109/tim.2022.3190052},
url = {https://doi.org/10.1109/tim.2022.3190052},
researchr = {https://researchr.org/publication/YangZDXP22},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {71},
pages = {1-8},
}