Hanyue Yang, Zhenfeng Zhu, Chen Lin, Wenjun Hui, Shenghui Wang 0003, Yao Zhao 0001. Self-Supervised Surface Defect Localization via Joint De-Anomaly Reconstruction and Saliency-Guided Segmentation. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]
Abstract is missing.