Joy Qiping Yang, Siyuan Zhou, Duc Van Le, Daren Ho, Rui Tan. Improving Quality Control with Industrial AIoT at HP Factories: Experiences and Learned Lessons. In 18th Annual IEEE International Conference on Sensing, Communication, and Networking, SECON 2021, Rome, Italy, July 6-9, 2021. pages 1-9, IEEE, 2021. [doi]
Abstract is missing.