Wenlong Yang, Wenchao Zhu, Changjun Xie. Reliability Study of Grid-Forming Energy Storage Systems with Coupled Thermal Runaway and Long-Term Capacity Degradation. In 51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025, Madrid, Spain, October 14-17, 2025. pages 1-6, IEEE, 2025. [doi]
Abstract is missing.