Li Yao, Zhongqin Chen, Yan Wan. Research on Fabric Defect Detection Technology Based on RDN-LTE and Improved DINO. In Bin Sheng 0001, Lei Bi 0001, Jinman Kim, Nadia Magnenat-Thalmann, Daniel Thalmann, editors, Advances in Computer Graphics - 40th Computer Graphics International Conference, CGI 2023, Shanghai, China, August 28 - September 1, 2023, Proceedings, Part III. Volume 14497 of Lecture Notes in Computer Science, pages 137-148, Springer, 2023. [doi]
Abstract is missing.