Jian Yao, Zuochang Ye, Yan Wang. Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(3):384-396, 2014. [doi]
@article{YaoYW14, title = {Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions}, author = {Jian Yao and Zuochang Ye and Yan Wang}, year = {2014}, doi = {10.1109/TCAD.2013.2292504}, url = {http://dx.doi.org/10.1109/TCAD.2013.2292504}, researchr = {https://researchr.org/publication/YaoYW14}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, volume = {33}, number = {3}, pages = {384-396}, }