Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi. Aliasing-free Signature Analysis for RAM BIST. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 368-377, IEEE Computer Society, 1994.
@inproceedings{YarmolikNK94,
title = {Aliasing-free Signature Analysis for RAM BIST},
author = {Vyacheslav N. Yarmolik and Michael Nicolaidis and O. Kebichi},
year = {1994},
tags = {analysis},
researchr = {https://researchr.org/publication/YarmolikNK94},
cites = {0},
citedby = {0},
pages = {368-377},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}