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Aliasing-free Signature Analysis for RAM BIST

Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi. Aliasing-free Signature Analysis for RAM BIST. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 368-377, IEEE Computer Society, 1994.

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