Jaya Satyanarayana Yarragunta, Antonio Aprile, Andreas Fugger, Francesco Conzatti, Edoardo Bonizzoni, Piero Malcovati. Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing. In 30th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2023, Istanbul, Turkey, December 4-7, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.