Moritoshi Yasunaga, Ikuo Yoshihara, Jung Hwan Kim. A High Speed and High Fault Tolerant Reconfigurable Reasoning System: Toward a Wafer Scale Reconfigurable Reasoning LSI. In 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. pages 69-77, IEEE Computer Society, 2000. [doi]
Abstract is missing.