Kohsuke Yatoh, Kazunori Sakamoto, Fuyuki Ishikawa, Shinichi Honiden. Feedback-controlled random test generation. In Michal Young, Tao Xie, editors, Proceedings of the 2015 International Symposium on Software Testing and Analysis, ISSTA 2015, Baltimore, MD, USA, July 12-17, 2015. pages 316-326, ACM, 2015. [doi]
Abstract is missing.