M. Baghaie Yazdi, M. Schmeidl, X. Wu, T. Neyer. A concise study of neutron irradiation effects on power MOSFETs and IGBTs. Microelectronics Reliability, 62:74-78, 2016. [doi]
@article{YazdiSWN16,
title = {A concise study of neutron irradiation effects on power MOSFETs and IGBTs},
author = {M. Baghaie Yazdi and M. Schmeidl and X. Wu and T. Neyer},
year = {2016},
doi = {10.1016/j.microrel.2016.03.027},
url = {http://dx.doi.org/10.1016/j.microrel.2016.03.027},
researchr = {https://researchr.org/publication/YazdiSWN16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {62},
pages = {74-78},
}