A concise study of neutron irradiation effects on power MOSFETs and IGBTs

M. Baghaie Yazdi, M. Schmeidl, X. Wu, T. Neyer. A concise study of neutron irradiation effects on power MOSFETs and IGBTs. Microelectronics Reliability, 62:74-78, 2016. [doi]

No reviews for this publication, yet.