Yaoyao Ye, Taeyoung Kim 0001, Hai-Bao Chen, Hai Wang 0002, Esteban Tlelo-Cuautle, Sheldon X.-D. Tan. Comprehensive detection of counterfeit ICs via on-chip sensor and post-fabrication authentication policy. In 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017, Giardini Naxos, Italy, June 12-15, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.