Accelerated Degradation Test Planning Using the Inverse Gaussian Process - researchr publication authors

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Zhi Sheng Ye, Liangpeng Chen, Loon Ching Tang, Min Xie 0001. Accelerated Degradation Test Planning Using the Inverse Gaussian Process. IEEE Transactions on Reliability, 63(3):750-763, 2014. [doi]

This author has not been identified. Look up 'Zhi Sheng Ye' in GoogleThis author has not been identified. Look up 'Liangpeng Chen' in GoogleThis author has not been identified. Look up 'Loon Ching Tang' in GoogleThis author has not been identified. Look up 'Min Xie 0001' in Google

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