Zhi Sheng Ye, Liangpeng Chen, Loon Ching Tang, Min Xie 0001. Accelerated Degradation Test Planning Using the Inverse Gaussian Process. IEEE Transactions on Reliability, 63(3):750-763, 2014. [doi]
@article{YeCTX14,
title = {Accelerated Degradation Test Planning Using the Inverse Gaussian Process},
author = {Zhi Sheng Ye and Liangpeng Chen and Loon Ching Tang and Min Xie 0001},
year = {2014},
doi = {10.1109/TR.2014.2315773},
url = {http://dx.doi.org/10.1109/TR.2014.2315773},
researchr = {https://researchr.org/publication/YeCTX14},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {63},
number = {3},
pages = {750-763},
}