Learning features for predicting OCR accuracy

Peng Ye, David S. Doermann. Learning features for predicting OCR accuracy. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 3204-3207, IEEE, 2012. [doi]

Authors

Peng Ye

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David S. Doermann

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