Peng Ye, David S. Doermann. Learning features for predicting OCR accuracy. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 3204-3207, IEEE, 2012. [doi]
@inproceedings{YeD12,
title = {Learning features for predicting OCR accuracy},
author = {Peng Ye and David S. Doermann},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6460846},
researchr = {https://researchr.org/publication/YeD12},
cites = {0},
citedby = {0},
pages = {3204-3207},
booktitle = {Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2216-4},
}