Jing Ye, Yu Hu, Xiaowei Li 0001. On diagnosis of multiple faults using compacted responses. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 679-684, IEEE, 2011. [doi]
@inproceedings{YeHL11-7, title = {On diagnosis of multiple faults using compacted responses}, author = {Jing Ye and Yu Hu and Xiaowei Li 0001}, year = {2011}, url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763115}, researchr = {https://researchr.org/publication/YeHL11-7}, cites = {0}, citedby = {0}, pages = {679-684}, booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011}, publisher = {IEEE}, isbn = {978-1-61284-208-0}, }